Power Semiconductor Devices and Packages: Solder Mechanical Characterization and Lifetime Prediction

نویسندگان

چکیده

Solder reliability is a key aspect for the packaging of low voltage power semiconductor device. The interconnections among package components, e.g. silicon chip and copper leadframe, between itself external printed control board (PCB) should be properly designed to ensure automotive durability requirements. In this framework, proposed paper introduces an experimental-numeric characterization flow with purpose analyze solder visco-plasticity fatigue during passive temperature cycle. presented methodology has included mechanical aimed determine parameters Anand model which reproduces visco-plastic behavior properties' dependency. Finite element been employed calculate inelastic work dissipates each Simulation results serve as input predict lifetime according energetic method. Moreover, failure analyses have performed assess mechanism check correlation in terms number cycles forecast.

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ژورنال

عنوان ژورنال: IEEE Access

سال: 2021

ISSN: ['2169-3536']

DOI: https://doi.org/10.1109/access.2021.3056281